Thin Elastic Films: The Impact of Higher Order Perturbations
and
Erratum

Irene Fonseca
Department of Mathematical Sciences
Carnegie Mellon University
Pittsburgh, PA 15213, USA
fonseca@andrew.cmu.edu

Gilles Francfort
L.P.M.T.M.
Universite' Paris-Nord
93430 Villetaneuse, France
francfor@lpmtm.univ-paris13.fr

Giovanni Leoni
Department of Mathematical Sciences
Carnegie Mellon University
Pittsburgh, PA 15213, USA
giovanni@andrew.cmu.edu

Abstract: The asymptotic behavior of an elastic thin film penalized by a van der Wals type interfacial energy is investigated when both its thickness and the magnitude of the additional energy vanish in the limit. Keeping track of both mid-plane and out of plane deformations (through the introduction of the Cosserat vector), the resulting behavior strongly depends upon the ratio between thickness and interfacial energy.

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