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Publication 59

Grain Growth and the Puzzle of its Stagnation in Thin Films: A Detailed Comparison of Experiments and Simulations

Authors:

CMUKatayun Barmak
Materials Research Science and Engineering Center and the Department of Materials Science and Engineering
Carnegie Mellon University
Pittsburgh, PA 15213, USA


CMUScott Roberts
Materials Research Science and Engineering Center and the Department of Materials Science and Engineering
Carnegie Mellon University
Pittsburgh, PA 15213, USA


CMUAnthony Rollett
Materials Research Science and Engineering Center and the Department of Materials Science and Engineering
Carnegie Mellon University
Pittsburgh, PA 15213, USA


CMUTerry Shyu
Materials Research Science and Engineering Center and the Department of Materials Science and Engineering
Carnegie Mellon University
Pittsburgh, PA 15213, USA


CMUDavid Kinderlehrer
Department of Mathematical Sciences
Carnegie Mellon University
Pittsburgh, PA 15213


CMUShlomo Ta'asan
Department of Mathematical Sciences
Carnegie Mellon University
Pittsburgh, PA 15213


CMURichard Sharp
Materials Research Science and Engineering Center and the Department of Mathematical Sciences
Carnegie Mellon University
Pittsburgh 15213, USA


Eva Eggeling
Fraunhofer Austria Research GmbH
Visual Computing
A-8010 Graz, Austria


Kevin Coffey
Advanced Materials Processing and Analysis Center
University of Central Florida
Orlando, FL 32816, USA


Tik Sun
Advanced Materials Processing and Analysis Center
University of Central Florida
Orlando, FL 32816, USA


Bo Yao
Advanced Materials Processing and Analysis Center
University of Central Florida
Orlando, FL 32816, USA


Abstract:
We revisit grain growth and the puzzle of its stagnation in thin metallic films. We bring together a large body of experimental data that includes the size of more than 30,000 grains obtained from 23 thin film samples of Al and Cu with thicknesses in the range of 25 to 158 nm. In addition to grain size, a broad range of other metrics such as the number of sides and the average side class of nearest neighbors is used to compare the experimental results with the results of two dimensional simulations of grain growth with isotropic boundary energy. In order to identify the underlying cause of the differences between these simulations and experiments, five factors are examined. These are (i) surface energy and elastic strain energy reduction, (ii) anisotropy of grain boundary energy, and retarding and pinning forces such as (iii) solute drag, (iv) grain boundary grooving and (v) triple junction drag. No single factor provides an explanation for the observed experimental behavior.
Get the paper in its entirety
10-CNA-012.pdf

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